PARALLEL SESSION
C1L-B
Reliability and Transport Modeling Session
SALA MOZART
THURSDAY- 10 September | 10:40 - 12:20
CHAIRS
Mike Schwarz, François Triozon
SESSION PROGRAM
10:40 - 11:00
Physics-Based Compact Modeling of Parasitic BJT Induced On-BV and Its Impact on Inverter Latch-Up Susceptibility in Hybrid CMOS Technology
Junhyeok Kim, Kyungchul Park, Hyotae Choo, Youngmok Kim, Sungjoon Park, Yongsang Jeong, Shigenobu Maeda, Jooyoung Son...
11:00 - 11:20
Cryo-CMOS Reliability Lifetime Prediction and Extension via Cryogenic-Aware Forward Body Bias
Elena Soli, Cristina Fernández-Ruiz, Andrei Vladimirescu, Masoud Babaie, Said Hamdioui, Fabio Sebastiano
11:20 - 11:40
Characterization and Modeling of the Effect of Lateral Electric Field in Cryo-CMOS Transistors
Sadık İlik, Gerd Kiene, Andrei Vladimirescu, Masoud Babaie, Fabio Sebastiano
11:40 - 12:00
Drift-Diffusion Simulation for Quantitative Interpretation of STEM-EBIC on FIB-Prepared Silicon p-n Junctions
Chenyang Yu, Sebastian Schneider, Bernd Rellinghaus, Christoph Jungemann
12:00 - 12:20
Insights and Criteria for an Efficient and Accurate Calculation of Self- and Cross-Heating Transients
Oleksandr Kyryliv, Luca Selmi