14:10-14:20

From Manual Tuning to Agentic AI: Transforming Device Modeling with AI/ML

Roberto Tinti, Keysight

 

14:20-14:45

From Device Degradation to Circuit Reliability: Aging Models for Predictive SPICE Simulation

Petr Hanys, OnSemi

 

14:50-15:10

Compact Modeling and Multi-scales Approaches for Radiation Hardening and Hardware Security

Neil Rostand, CEA-Leti

 

15:30-15:55

Emerging Challenges in Power Semiconductor Device Modeling – From Data Centers to Electric Vehicles

Miguel Martins. Infineon

 

16:00-16:20

From Faster Measurements to Smarter Diagnostics: Machine Learning for Next-Generation E-Test

Jerome Mitard, imec

 

16:25-16:45

Development and Integration of an ML-based Surrogate Model for RF Passive Devices in a Commercial RF CAD Flow to Enable an RFIC Design Agent

Romain Demarchi, STMicroelectronics

​

16:50-17:20

Pannel Session